Electronic structure of anodic oxide films formed on cobalt by cyclic voltammetry

Corrosion Science

Volumn 48, Issue 10, 2006, Pages 2971-2986

  Pontinha, M ^a,d   Faty, S ^b   Walls, M G ^c   Ferreira, M G S ^a,e   Cunha Belo, M Da ^a,c  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b UNIVERSITÉ CHEIKH ANTA DIOP   (Senegal)

^c CNRS   (France)

^d INSTITUTO SUPERIOR DE ENGENHARIA DE LISBOA   (Portugal)

^e UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Cobalt oxide films; Cyclic voltammetry; Electronic structure

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT; COMPOSITION; CYCLIC VOLTAMMETRY; ELECTRONIC STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

COBALT OXIDE FILMS; GROWTH MECHANISMS; LATTICE IONIC DEFECTS;

THIN FILMS;

AUGER ELECTRON SPECTROSCOPY; COBALT; COMPOSITION; CYCLIC VOLTAMMETRY; ELECTRONIC STRUCTURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33748784593     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2005.10.007     Document Type: Article

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