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Analytical Chemistry

Volumn 78, Issue 18, 2006, Pages 6457-6464

Probing topography and tailing for commercial stationary phases using AFM, FT-IR, and HPLC

(2) Legg, Michael A a Wirth, Mary J a

a University of Arizona (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE FORCE MEASUREMENTS; CHROMOLITH PRODUCTS; STATIONARY PHASES; SYMMETRY MATERIAL;

ADHESION; ATOMIC FORCE MICROSCOPY; CHROMATOGRAPHIC ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; MONOLAYERS; NONLINEAR SYSTEMS; SILICA;

SURFACE TOPOGRAPHY;

1,1' DIDODECYL 3,3,3',3' TETRAMETHYLINDOCARBOCYANINE PERCHLORATE; DYE; GLASS; MONOMER; SILANE DERIVATIVE; SILICON DIOXIDE; UNCLASSIFIED DRUG;

ADHESION; ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHROMATOGRAPHY; CONCENTRATION (PARAMETERS); FORCE; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INFRARED SPECTROSCOPY; MATERIALS; MEASUREMENT; SIMULATION; SURFACE PROPERTY; TOPOGRAPHY;

CHROMATOGRAPHY, GEL; CHROMATOGRAPHY, HIGH PRESSURE LIQUID; MICROSCOPY, ATOMIC FORCE; SILICON DIOXIDE; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES;

EID: 33748780957 PISSN: 00032700 EISSN: None Source Type: Journal
DOI: 10.1021/ac060820f Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.