Strain tolerance in technical Nb3Al superconductors

Superconductor Science and Technology

Volumn 19, Issue 10, 2006, Pages 1057-1062

  Banno, N ^a   Takeuchi, T ^a   Kitaguchi, H ^a   Tagawa, K ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b HITACHI CABLE LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (FORMING); CRACK INITIATION; DEGRADATION; FIELD EMISSION MICROSCOPES; NIOBIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; STRAIN CONTROL; WIRE;

BEND STRAIN LIMITS; CLAMP FIXTURES; DOUBLE STACKING METHOD; WIRE SURFACE;

SUPERCONDUCTING MATERIALS;

EID: 33748773087     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/19/10/012     Document Type: Article

References (12)

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12. Banno N and Takeuchi T 2006 Patent pending