SXD - The single-crystal diffractometer at the ISIS spallation neutron source

Journal of Applied Crystallography

Volumn 39, Issue 5, 2006, Pages 714-722

  Keen, David A ^a   Gutmann, Matthias J ^a   Wilson, Chick C ^b  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33748766083     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806025921     Document Type: Article

References (26)

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