Domain-wall trapping in controlled mesoscopic ferromagnetic wire junctions

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue PART II, 2001, Pages 1845-1847

  Hirohata, A ^a   Xu, Y B ^a   Yao, C C ^a   Leung, H T ^a   Lee, W Y ^a   Gardiner, S M ^a   Hasko, D G ^a   Bland, J A C ^a   Holmes, S N ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

Domain structure; Magnetic force microscopy; Micromagnetic calculation; Microstructure

Indexed keywords

MAGNETIC DOMAINS; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION REVERSAL; MICROSTRUCTURE; NICKEL ALLOYS;

DOMAIN CONFIGURATIONS; DOMAIN STRUCTURE; DOMINANT PROCESS; FERROMAGNETIC WIRES; MAGNETIC FORCE MICROSCOPIES (MFM); MICROMAGNETIC CALCULATIONS; PERMALLOY WIRES; REMANENT STATE;

DOMAIN WALLS;

EID: 33748712026     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(00)00880-5     Document Type: Article

References (8)

1. Positive domain wall resistivity has been reported by U. Ebels et al., Phys. Rev. Lett. 84 (2000) 983;
2. Y. B. Xu, et al., Phys. Rev. B 61 (2000) R14901.
3. Negative resistivity has been reported by U. Ruediger et al., Phys. Rev. Lett. 80 (1998) 5639;
4. T. Taniyama et al, Phys. Rev. Lett. 82 (1999) 2780.
5. Positive contribution has been claimed by P.M. Levy, S. Zhang, Phys. Rev. Lett. 79 (1997) 5110.
6. Negative contribution has been claimed by G. Tatara, H. Fukuyama, Phys. Rev. Lett. 78 (1997) 3773.
7. A. Hirohata et al., J. Appl. Phys. 87 (2000) 4727.
8. T. Schrefl et al, J. Magn. Magn. Mater. 175 (1997) 193.