Simulational study of annealing effects in multilayers

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue PART I, 2001, Pages 666-668

  Lima, A R ^a   Ferreira, M S ^a   D'Albuquerquee Castro, J ^b   Muniz, R B ^a  

^a Niteroi   (Brazil)

^b FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

Annealing effect; Interface roughness; Multilayers

Indexed keywords

INTERFACES (MATERIALS); MULTILAYERS; PHASE INTERFACES;

ANNEALING EFFECTS; ANNEALING TEMPERATURES; AVERAGE NUMBERS; BACK DIFFUSION; DIFFERENT LAYERS; INTERFACE QUALITY; INTERFACE ROUGHNESS; ISING LATTICE GAS;

ANNEALING;

EID: 33748697842     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00085-3     Document Type: Article

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