Scaling of dark count rate with active area in 1.06 μm photon-counting InGaAsP/InP avalanche photodiodes

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Dauler, E A ^a   Hopman, P I ^a   Mclntosh, K A ^a   Donnelly, J P ^a   Duerr, E K ^a   Magliocco, R J ^a   Mahoney, L J ^a   Molvar, K M ^a   Napoleone, A ^a   Oakley, D C ^a   O'Donnell, F J ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GEIGER MODE; ON STATE RESISTANCE; OPTICAL COUPLING; PHOTON DETECTION;

PHOTODETECTORS; PHOTODIODES; PHOTONS; SEMICONDUCTING INDIUM PHOSPHIDE;

AVALANCHE DIODES;

EID: 33748692732     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2243800     Document Type: Article

References (12)

1. D. M. Boroson, R. S. Bondurant, and D. V. Murphy, Proc. SPIE 5339, 16 (2004).
2. B. S. Robinson, D. O. Caplan, M. L. Stevens, R. J. Barron, E. A. Dauler, S. A. Hamilton, K. A. McIntosh, J. P. Donnelly, E. K. Duerr, and S. Verghese, 2005 IEEE LEOS Annual Meeting, 559 (2005).
3. N. Gisin, G. G. Ribordy, W. Tittel, and H. Zbinden, Rev. Mod. Phys. 74, 145 (2002).
4. B. F. Aull, A. H. Loomis, D. J. Young, R. M. Heinrichs, B. J. Felton, P. J. Daniels, and D. J. Landers, Lincoln Lab. J. 13, 335 (2002).
5. J. P. Donnelly, E. K. Duerr, K. A. McIntosh, E. A. Dauler, D. C. Oakley, S. H. Groves, C. J. Vineis, L. J. Mahoney, K. M. Molvar, P. I. Hopman, K. E. Jensen, G. M. Smith, S. Verghese, and D. C. Shaver IEEE J. Quantum Electron. 42, 797 (2006).
6. K. A. McIntosh, J. P. Donnelly, D. C. Oakley, A. Napoleone, S. D. Calawa, L. J. Mahoney, K. M. Molvar, E. K. Duerr, S. H. Groves, and D. C. Shaver, Appl. Phys. Lett. 81, 2505 (2002).
7. A. Lacaita, F. Zappa, S. Cova, and P. Lovati, Appl. Opt. 35, 2986 (1996).
8. D. Stucki, G. Ribordy, A. Stefanov, H. Zbinden, J. G. Rarity, and T. Wall, J. Mod. Opt. 48, 1967 (2001).
9. D. S. Bethune, W. P. Risk, and G. W. Pabst, J. Mod. Opt. 51, 1359 (2004).
10. 2 diameter of 2.8 μm.
11. The measured photosensitive region may be larger than the absorber size due to total internal reflection from the sloped sidewalls of the multiplication layer.
12. The full width at half maximum (FWHM) of the vertical and horizontal PDE profiles varied by up to 1.2 μm.