Perturbation techniques in the problems of computational charged particle optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6278, Issue , 2006, Pages

  Greenfield, Dmitry ^a   Monastyrskiy, Mikhail A ^b   Tarasov, Victor A ^b  

^a Federal State Unitary Enterprise   (Russian Federation)

^b PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

Aberrations; Charged particle optics; Computer simulation; Perturbation theory

Indexed keywords

CHARGED PARTICLE OPTICS; COULOMB REPULSION EFFECTS; FRINGE FIELDS; PLANAR SYMMETRY;

ABERRATIONS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRODES; NUMERICAL METHODS; PARAMETER ESTIMATION; PERTURBATION TECHNIQUES; TENSORS;

CHARGED PARTICLES;

EID: 33748683636     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.693186     Document Type: Conference Paper

References (4)

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2. A.N. Verenchikov, N.V. Krasnov, L.N. Gall, Tandem mass spectrometry in biochemistry, Nauchnoe Priborostroenie, 14 (2004) N2, pp. 4-23.
3. D. Zajftnan et al. High resolution mass spectrometry using a linear electrostatic ion beam trap. International Journal of Mass Spectrometry, 229 (2003), pp. 55-60.
4. Aleksey V. Tolmachev et al. Charge Capacity Limitations of Radio Ion Guides in Their Use for Improved Accumulation and Trapping in Mass, Anal. Chem., 72 (2000), pp. 970-978.