Properties of Fe/Si multilayered films with very thin sublayers

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue PART II, 2001, Pages 1790-1791

  Lee, Y P ^a   Kim, C O ^a   Baek, J Y ^b   Kim, K W ^b   Rhee, J Y ^c   Kudryavtsev, Y V ^d   Dubowik, J ^e  

^a Hanyang University   (South Korea)

^b SunMoon University   (South Korea)

^c Hoseo University   (South Korea)

^d INSTITUTE OF METAL PHYSICS   (Ukraine)

^e INSTITUTE OF MOLECULAR PHYSICS   (Poland)

Author keywords

Interfaces; Multilayers; Optical properties

Indexed keywords

ANNEALING; INTERFACES (MATERIALS); MULTILAYERS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; ULTRATHIN FILMS;

CRYSTALLINITIES; MAGNETIC AND OPTICAL PROPERTIES; MULTI-LAYERED FILMS; POST ANNEALING; SUB-LAYERS; ULTRA-THIN;

OPTICAL FILMS;

EID: 33748680920     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00124-X     Document Type: Article

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