Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

Optical Engineering

Volumn 45, Issue 2, 2006, Pages

  Chen, Kun Huang ^a   Chen, Jing Heng ^a   Lin, Jiun You ^b  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

Critical angle; Phase difference shift; Small refractive index variation; Surface plasmon resonant angle

Indexed keywords

DIFFERENCE EQUATIONS; POLARIZATION; REFLECTION; SURFACE PLASMON RESONANCE;

CRITICAL ANGLE; KRETSCHMANN-RAETHER CONFIGURATION; PHASE DIFFERENCE EQUATION; PHASE DIFFERENCE SHIFT;

REFRACTIVE INDEX;

EID: 33748646401     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2172346     Document Type: Article

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