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Volumn 93, Issue 13, 1997, Pages 2291-2295

Anodic sulfide films on HgTe and Cd0.24Hg0.76Te studied by in-situ ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords


EID: 33748634105     PISSN: 09565000     EISSN: None     Source Type: Journal    
DOI: 10.1039/a701067b     Document Type: Article
Times cited : (9)

References (38)
  • 24
    • 33748606751 scopus 로고
    • PhD Thesis, University of Tubingen, Germany
    • M. Seelman-Eggebert, PhD Thesis, University of Tubingen, Germany, 1986.
    • (1986)
    • Seelman-Eggebert, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.