Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 2006, Issue , 2006, Pages 110-111

  Katsuki, Kazuya ^a   Kotani, Manabu ^a   Kobayashi, Kazutoshi ^a   Onodera, Hidetoshi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; SIGNAL PROCESSING; SPEED CONTROL; YIELD STRESS;

DIE VARIATIONS; PERFORMANCE FLUCTUATIONS; RECONFIGURABLE DEVICES; YIELD ENHANCEMENT;

ANTENNA ARRAYS;

EID: 33748625693     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1118299.1118331     Document Type: Conference Paper

References (1)

1. IEEE Transactions on Semiconductor Manufacturing, Vol.17, No.2