Evolution of passivity in air exposure of an iron passive film

Electrochimica Acta

Volumn 52, Issue 1, 2006, Pages 187-193

  Deng, Huihua ^a   Nanjo, Hiroshi ^a   Qian, Pu ^a   Xia, Zhengbin ^a   Ishikawa, Ikuo ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Air formed film; Open circuit breakdown; Passivity; Pre exposure effect; Recovery duration

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CIRCUIT BREAKERS; ELECTROCHEMISTRY; IONS; IRON; SURFACE STRUCTURE;

AIR-FORMED FILM; OPEN-CIRCUIT BREAKDOWN; PRE-EXPOSURE EFFECT; RECOVERY DURATION;

THIN FILMS;

EID: 33748624062     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.04.057     Document Type: Article

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