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Volumn 2006, Issue , 2006, Pages 947-952

Parameterized block-based non-gaussian statistical gate timing analysis

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC WIRE; MATHEMATICAL MODELS; MONTE CARLO METHODS; PARAMETER ESTIMATION; STATISTICAL METHODS; TIME DOMAIN ANALYSIS;

EID: 33748615408     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1118299.1118512     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 1
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and analysis of manufacturing variations
    • S. Nassif, "Modeling and Analysis of Manufacturing Variations," CICC, 2001, pp. 223-228.
    • (2001) CICC , pp. 223-228
    • Nassif, S.1
  • 4
    • 0032641923 scopus 로고    scopus 로고
    • Model order reduction of RC(L) interconnect including variational analysis
    • Y. Liu, L. T. Pileggi, and A. J. Strojwas, "Model Order Reduction of RC(L) Interconnect Including Variational Analysis," DAC, 1999, pp. 201-206.
    • (1999) DAC , pp. 201-206
    • Liu, Y.1    Pileggi, L.T.2    Strojwas, A.J.3
  • 5
    • 16244379543 scopus 로고    scopus 로고
    • Interval-valued reduced order statistical interconnect modeling
    • J.D. MA and R.A. Rutenbar, "Interval-Valued Reduced Order Statistical Interconnect Modeling," ICCAD, 2004, pp. 460-467.
    • (2004) ICCAD , pp. 460-467
    • Ma, J.D.1    Rutenbar, R.A.2
  • 7
    • 4444374515 scopus 로고    scopus 로고
    • Statistical gate delay model considering multiple input switching
    • A. Agarwal, F. Dartu, D.Blaauw, "Statistical Gate Delay Model Considering Multiple Input Switching," DAC, 2004, pp. 658-663.
    • (2004) DAC , pp. 658-663
    • Agarwal, A.1    Dartu, F.2    Blaauw, D.3
  • 8
    • 0346778705 scopus 로고    scopus 로고
    • A statistical gate-delay model considering intra-gate variability
    • K. Okada, K. Yamaoka, and H. Onodera, "A statistical gate-delay model considering intra-gate variability" ICCAD, 2003, pp. 908-913.
    • (2003) ICCAD , pp. 908-913
    • Okada, K.1    Yamaoka, K.2    Onodera, H.3
  • 9
    • 0032272981 scopus 로고    scopus 로고
    • Modeling the effects of manufacturing variation on high-speed microprocessor interconnect performance
    • V. Mehrotra, S. Nassif, D. Boning, and J. Chung, "Modeling the Effects of Manufacturing Variation on High-Speed Microprocessor Interconnect Performance," IEEE Electron Devices Meetings, 1998, pp. 767-770.
    • (1998) IEEE Electron Devices Meetings , pp. 767-770
    • Mehrotra, V.1    Nassif, S.2    Boning, D.3    Chung, J.4
  • 10
    • 0024906813 scopus 로고
    • Modeling the driving-point characteristics of resistive interconnect for accurate delay estimation
    • P.R. O'Brien and T. L. Savarino, "Modeling the Driving-Point Characteristics of Resistive Interconnect for Accurate Delay Estimation," ICCAD, 1989, pp.512-515.
    • (1989) ICCAD , pp. 512-515
    • O'Brien, P.R.1    Savarino, T.L.2
  • 11
    • 0032715195 scopus 로고    scopus 로고
    • Improved effective capacitance computations for use in logic and layout optimization
    • A.B. Kahng, S. Muddu, "Improved effective capacitance computations for use in logic and layout optimization," VLSI Design, 1999, pp. 578-582.
    • (1999) VLSI Design , pp. 578-582
    • Kahng, A.B.1    Muddu, S.2
  • 12
    • 0030141612 scopus 로고    scopus 로고
    • Performance computation for precharacterized gates with RC loads
    • F. Dartu, N. Menezes, and L. Pillegi, "Performance Computation for Precharacterized Gates with RC Loads," IEEE Trans. On Computer Aided Design 15(5):544-533, 1996.
    • (1996) IEEE Trans. on Computer Aided Design , vol.15 , Issue.5 , pp. 544-1533
    • Dartu, F.1    Menezes, N.2    Pillegi, L.3
  • 13
    • 84954440271 scopus 로고    scopus 로고
    • Calculating the effective capacitance for the RC interconnect in VDSM technologies
    • S. Abbaspour, M. Pedram, "Calculating the Effective Capacitance for the RC Interconnect in VDSM Technologies," ASPDAC, 2003.
    • (2003) ASPDAC
    • Abbaspour, S.1    Pedram, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.