-
1
-
-
0032674029
-
Subwavelength lithography and its potential impact on design and EDA
-
Andrew B. Kahng and Y. C. Pati, "Subwavelength lithography and its potential impact on design and EDA," IEEE/ACM Design Automation Conf, pp. 799-804, 1999.
-
(1999)
IEEE/ACM Design Automation Conf
, pp. 799-804
-
-
Kahng, A.B.1
Pati, Y.C.2
-
2
-
-
28744454436
-
Numerical modeling and characterization of the stress migration behavior upon various 90 nanometer Cu/Low k interconnects
-
T.C. Huang and C.H. Yao and W.K. Wan and Chin C. Hsia and M.S. Liang, "Numerical modeling and characterization of the stress migration behavior upon various 90 nanometer Cu/Low k interconnects," IEEE International Interconnect Technology Conference, pp. 207-209, 2003.
-
(2003)
IEEE International Interconnect Technology Conference
, pp. 207-209
-
-
Huang, T.C.1
Yao, C.H.2
Wan, W.K.3
Hsia, C.C.4
Liang, M.S.5
-
3
-
-
84955314181
-
Stress-induced voiding and its geometry dependency characterization
-
Kelvin Y.Y. Doong and Robin C.J. Wang and S.C. Lin and L.J. Huang and S.Y. Lee and C.C. Chiu and David Su and Kenneth Wu and K.L. Young and Y.K. Peng, "Stress-induced voiding and its geometry dependency characterization, " IEEE International Interconnect Technology Conference, pp. 156-160, 2003.
-
(2003)
IEEE International Interconnect Technology Conference
, pp. 156-160
-
-
Doong, K.Y.Y.1
Wang, R.C.J.2
Lin, S.C.3
Huang, L.J.4
Lee, S.Y.5
Chiu, C.C.6
Su, D.7
Wu, K.8
Young, K.L.9
Peng, Y.K.10
-
8
-
-
0027141529
-
Cost-driven layout for thin film MCMs
-
Wayne Wei-Ming Dai, David Staepelaere, Jeffrey Jue and Tal Dayan, "Cost-driven layout for thin film MCMs," Proc. IEEE MCM Conf, pp. 174-178, 1993.
-
(1993)
Proc. IEEE MCM Conf
, pp. 174-178
-
-
Dai, W.W.-M.1
Staepelaere, D.2
Jue, J.3
Dayan, T.4
-
10
-
-
0030389236
-
Interchangeable pin routing with application to package layout
-
Santa Clara, CA, Nov.
-
Man-Fai Yu, Joel Darnauer, Wayne Wei-Ming Dai "Interchangeable pin routing with application to package layout," Proc. Intl. Conf. Computeraided Design, Santa Clara, CA, Nov., 1996.
-
(1996)
Proc. Intl. Conf. Computeraided Design
-
-
Yu, M.-F.1
Darnauer, J.2
Dai, W.W.-M.3
-
11
-
-
0037390344
-
TEG: A new post-layout optimization method
-
S. Zhang and W. Dai, "TEG: a new post-Layout optimization method," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 22, Num. 2, pp. 1-12, 2003.
-
(2003)
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems
, vol.22
, Issue.2
, pp. 1-12
-
-
Zhang, S.1
Dai, W.2
-
13
-
-
33748593508
-
-
Master's Thesis, University of California, Santa Cruz
-
Fangyi Luo, "Layout Wiring Generation," Master's Thesis, University of California, Santa Cruz, 2004.
-
(2004)
Layout Wiring Generation
-
-
Luo, F.1
-
14
-
-
0016072017
-
Applying a composite model to the IC yield problem
-
R. M. Warner, Jr., "Applying a composite model to the IC yield problem," IEEE J. Solid-State Circuits, Vol. SC-9, pp. 86-95, 1974.
-
(1974)
IEEE J. Solid-state Circuits
, vol.SC-9
, pp. 86-95
-
-
Warner Jr., R.M.1
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