Optimization of layer-by-layer electrostatic self-assembly processing parameters for optical biosensing

Optical Engineering

Volumn 45, Issue 2, 2006, Pages

  Shibru, Helen ^a   Zhang, Yan ^a   Cooper, Kristie L ^a   Pickrell, Gary R ^b   Wang, Anbo ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b Virginia Polytechnic Institute and State University   (United States)

Author keywords

Ellipsometry; Fiber optic sensors; Long period fiber gratings; Refractive index control; Refractometry; Self assembled thin films

Indexed keywords

DIFFRACTION GRATINGS; ELLIPSOMETRY; OPTICAL FILMS; OPTIMIZATION; REFRACTIVE INDEX; REFRACTOMETERS; SELF ASSEMBLY; THIN FILMS;

LONG-PERIOD FIBER GRATINGS; OPTICAL BIOSENSING; REFRACTIVE INDEX CONTROL; SELF-ASSEMBLED THIN FILMS;

FIBER OPTIC SENSORS;

EID: 33748601834     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2167090     Document Type: Article

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