Six-coordinate aluminium cations: Synthesis, characterization and catalysis

Journal of the Chemical Society - Dalton Transactions

Volumn , Issue 15, 1999, Pages 2583-2587

  Jegier, Jolin A ^a   Muñoz Hernández, Miguel Ángel ^a   Atwood, David A ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33748588725     PISSN: 03009246     EISSN: None     Source Type: Journal    
DOI: 10.1039/a902740h     Document Type: Article

References (19)

1. 2.
2. S. J. Dzugan and V. L. Goedken, Inorg. Chem., 1986, 25, 2858;
3. W.-H. Leung, E. Y. Y. Chan, E. K. F. Chow, I. D. Williams and S.-M. Peng, J. Chem. Soc., Dalton Trans., 1996, 1229.
4. K. S. Chong, S. J. Rettig, A. Storr and J. Trotter, Can. J. Chem., 1977, 55, 2540;
5. M. S. Hill and D. A. Atwood, Eur. J. Inorg. Chem., 1998, 67.
6. D. A. Atwood, J. A. Jegier and D. Rutherford, Bull. Chem. Soc. Jpn., 1997, 70, 2093;
7. M. S. Hill and D. A. Atwood, Main Group Chem., 1998, 2, 191.
8. D. Rutherford and D. A. Atwood, Organometallics, 1996, 15, 4417.
9. P. L. Gurian, L. K. Cheatham, J. W. Ziller and A. R. Barron, J. Chem. Soc., Dalton Trans., 1991, 1449.
10. D. A. Atwood, M. S. Hill, J. A. Jegier and D. Rutherford, Organometallics, 1997, 16, 2659.
11. (a) D. A. Atwood, J. A. Jegier and D. Rutherford, J. Am. Chem. Soc., 1995, 117, 6779;
12. (b) M. G. Davidson, C. Lambert, I. Lopez-Solera, P. R. Raithby and R. Snaith, Inorg. Chem., 1995, 34, 3765;
13. (c) D. A. Atwood, J. A. Jegier and D. Rutherford, Inorg. Chem., 1996, 35, 63.
14. T. Aida and S. Inoue, Acc. Chem. Res., 1996, 29, 39.
15. P. Wei and D. A. Atwood, Inorg. Chem., 1997, 36, 4060.
16. T. Saegusa, T. Ueshima and S. Tomita, Makromol. Chem., 1967, 107, 131;
17. I. Kuntz, C. Cozewith, H. T. Oakley, G. Via, H. T. White and Z. W. Wilchinsky, Macromolecules, 1971, 4, 4.
18. G. Casiraghi, G. Casnati, G. Puglia, G. Sartori and G. Terenghi, J. Chem. Soc., Perkin Trans. 1, 1980, 1862.
19. G. M. Sheldrick, SHELXTL-PLUS, Program package for structure solution and refinement, version 4.2, Siemens Analytical X-Ray Instruments, Madison, WI, 1990.