Grain-boundary-defects-induced switching in Zn-Bi-Mo ceramic

Defect and Diffusion Forum

Volumn 251-252, Issue , 2006, Pages 13-20

  El Hofy, M ^a  

^a Menoufia University   (Egypt)

Author keywords

Grain Boundary Defects; Microstructure; Non Ohmic Characteristics; Voltage Switching; ZnO Mo:Bi Ceramic

Indexed keywords

DEFECTS; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SINTERING; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

GRAIN-BOUNDARY DEFECTS; NON-OHMIC CHARACTERISTICS; VOLTAGE SWITCHING; ZNO-MO:BI CERAMIC;

CERAMIC MATERIALS;

EID: 33748578602     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.251-252.13     Document Type: Article

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