Auto-correction and design-for-testability in embedded measurement systems

12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation

Volumn , Issue , 2002, Pages 79-82

  Frühauf, Uwe ^a   Kranz, Ernst Georg ^a   Leuterer, Hellmut ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Analogue boundary scan; Auto correction; Design for testability; Embedded measurement system; Evaluation system

Indexed keywords

DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS;

AUTOCORRECTION; BIT RESOLUTION; BOUNDARY SCAN; EVALUATION SYSTEM; HIGH-RESOLUTION MEASUREMENTS; MEASUREMENT SYSTEM; SELF-DIAGNOSTICS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 33748576700     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. U. Frühauf, J.-G. Liu: "Fault-tolerant measurements of electrical quantities based on self-calibration", XV IMEKO-World Congress, Osaka (Japan) June 13-18, 1999, Proceedings Vol. IV, pp 135-142
2. J.-G. Liu: "Eigenkalibrierende Messverfahren und deren Anwendungen bei den Messungen elektrischer Größen", Fortschritt-Berichte VDI Reihe 8 Mess-, Steuerungs- und Regelungstechnik, Nr. 830 VDI-Verlag, Düsseldorf 2000, ISBN 3-18-383008-6
3. -: "IEEE 1149.4 Analog Test Access Device", National Semiconductor Corporation, DS200041, 2000