Influence of non-uniformity of IRFPA responsibility on system sensitivity

Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering

Volumn 35, Issue 3, 2006, Pages 258-261

  Wang, Ying Rui ^a  

^a INSTITUTE OF REMOTE SENSING APPLICATIONS   (China)

Author keywords

Infrared focal plane array; Infrared system; Response non uniformity; Sensitivity

Indexed keywords

INFRARED FOCAL PLANE ARRAY; NOISE EQUIVALENT FLUX DENSITY (NEFD); NOISE EQUIVALENT TEMPERATURE DIFFERENCE (NETD); RESPONSE NON-UNIFORMITY;

ACOUSTIC NOISE; INFRARED RADIATION; LASER ABLATION; SENSITIVITY ANALYSIS;

SYSTEMS ANALYSIS;

EID: 33748575578     PISSN: 10072276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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2. CHEN Bao-guo, ZHENO Zhi-wei, HUANG Shi-ke,et al. IRFPA nonuniformity correction using the FPGA technology [J].Infrared and Laser Engineering, 2000, 29(4):55-57.
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