Modeling of thin layer yielding in polymers

Journal of Macromolecular Science, Part B: Physics

Volumn 45 B, Issue 5, 2006, Pages 727-739

  Michler, G H ^a   Kausch, H H ^b   Adhikari, R ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b EPFL   (Switzerland)

Author keywords

Amorphous polymers; Crazing; Electron microscopy; Entanglement network; Micromechanisms; Plastic yielding

Indexed keywords

BLOCK COPOLYMERS; CRAZING; DUCTILITY; ELECTRON MICROSCOPY; TENSILE STRESS;

AMORPHOUS POLYMERS; ENTANGLEMENT NETWORK; MICROMECHANISMS; PLASTIC YIELDING;

POLYSTYRENES;

EID: 33748567451     PISSN: 00222348     EISSN: 1525609X     Source Type: Journal    
DOI: 10.1080/00222340600890505     Document Type: Article

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