Subsurface defect detection in metals with pulsed eddy current

AIP Conference Proceedings

Volumn 760, Issue , 2005, Pages 447-454

  Plotnikov, Yuri A ^a   Bantz, Walter J ^b  

^a GE GLOBAL RESEARCH   (United States)

^b GE AVIATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33748559354     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1916710     Document Type: Conference Paper

References (2)

1. S. Norton, A. Kahn and M. Mester, Reconstructing Electrical Conductivity Profiles from Variable-Frequency Eddy Current Measurements, Res. NDE, No. 3, 1989, pp. 167-179.
2. Y.A. Plotnikov, S.C. Nath, and C.W. Rose, Defect Characterization in Multi-Layered Conductive Components with Pulsed Eddy Current, in: Review of progress in QNDE, Vol. 21A, AIP, N.Y., 2002, pp. 1976-1983.