Phase change memory faults

Proceedings of the IEEE International Conference on VLSI Design

Volumn 2006, Issue , 2006, Pages 108-113

  Mohammad, Mohammad Gh ^a   Terkawi, Laila ^a   Albasman, Muna ^a  

^a KUWAIT UNIVERSITY   (Kuwait)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; FLASH MEMORY; MATHEMATICAL MODELS;

CMOS PROCESS TECHNOLOGY; MEMORY TECHNOLOGY; NON-VOLATILE MEMORY; PHASE CHANGE MEMORY (PCM);

DATA STORAGE EQUIPMENT;

EID: 33748558097     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSID.2006.134     Document Type: Conference Paper

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