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Volumn 155, Issue 1-2, 2006, Pages 151-155

Advanced X-ray laboratory microbeam techniques applied to metallurgy

Author keywords

Energy Dispersive X ray Spectroscopy (EDXS); Scanning electron microscopy (SEM); X ray microdiffraction ( XRD); X ray microfluorescence ( XRF)

Indexed keywords


EID: 33748554065     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0534-9     Document Type: Conference Paper
Times cited : (1)

References (11)
  • 9
    • 33748532770 scopus 로고    scopus 로고
    • Daniel P L, Stringer J, Banerjee D D (1991) Elsevier Science Publ. B. V, p 207
    • Daniel P L, Stringer J, Banerjee D D (1991) Elsevier Science Publ. B. V, p 207
  • 11
    • 33748569072 scopus 로고
    • Transactions of the ASME
    • Krause H H et al (1973) Transactions of the ASME, J Eng Power, Series A 95: 44
    • (1973) J Eng Power, Series A , vol.95 , pp. 44
    • Krause, H.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.