Quantitative bulk and trace element X-ray mapping using multiple detectors

Microchimica Acta

Volumn 155, Issue 1-2, 2006, Pages 59-66

  Moran, Ken ^a   Wuhrer, Richard ^b  

^a Moran Scientific Pty Ltd   (Australia)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

Dual turret detector; Multi detectors; Speckle filter; Trace element mapping; X ray mapping

Indexed keywords

EID: 33748553052     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0507-z     Document Type: Conference Paper

References (6)

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4. Moran K J, Wuhrer R (2005) AMAS VIII-the eighth-biennial Symposium. University of Melbourne, p 29
5. Wuhrer R, Moran K J (2005) AMAS VIII-the eighth-biennial Symposium. University of Melbourne, p 109
6. Zaluzec N, Iwanczyk J S, Patt B E, Barkan S, Feng L (2003) Microscopy Microanal 9 [Suppl] 2: 230