X-ray mapping and interpretation of scatter diagrams

Microchimica Acta

Volumn 155, Issue 1-2, 2006, Pages 209-217

  Moran, Ken ^a,b   Wuhrer, Richard ^b  

^a Moran Scientific Pty Ltd   (Australia)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

Correlation diagram; EPMA; Intensity histograms; Scatter diagrams; X ray mapping

Indexed keywords

EID: 33748540109     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0545-6     Document Type: Conference Paper

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