Topography in secondary ion mass spectroscopy images

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 5, 2006, Pages 1730-1736

  Rangarajan, Srinath ^a   Tyler, Bonnie J ^a  

^a Department of Electrical and Computer Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PLURONIC COATED FIBERS; PLURONIC SURFACTANTS; REFLECTRON GEOMETRY; SAMPLE CHEMISTRY;

COMPUTATIONAL GEOMETRY; IMAGE ANALYSIS; INSULATING MATERIALS; ION SOURCES; MATHEMATICAL MODELS; POLYSTYRENES; SURFACE ACTIVE AGENTS;

SECONDARY ION MASS SPECTROMETRY;

EID: 33748537772     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2217980     Document Type: Article

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