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Volumn 760, Issue , 2005, Pages 1423-1430
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True-3D strain mapping for assessment of material deformation by synchrotron X-ray microtomography
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33748527246
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.1916838 Document Type: Conference Paper |
Times cited : (4)
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References (2)
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