Stacking structure in disordered talc: Interpretation of its X-ray diffraction pattern by using pattern simulation and high-resolution transmission electron microscopy

American Mineralogist

Volumn 91, Issue 8-9, 2006, Pages 1363-1370

  Kogure, Toshihiro ^a   Kameda, Jun ^a   Matsui, Tomoyuki ^a   Miyawaki, Ritsuro ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b DEPARTMENT OF BOTANY   (Japan)

Author keywords

Crystal structure; Electron microscopy; Order disorder; Polytypism; Talc; XRD data

Indexed keywords

AGGREGATES; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; MAGNESIUM COMPOUNDS; ORDER DISORDER TRANSITIONS; SILICON COMPOUNDS; TALC; TRANSMISSIONS; X RAY DIFFRACTION;

INTERLAYER DISPLACEMENTS; INTERLAYER REGIONS; LATERAL DISPLACEMENTS; POLYTYPISM; POWDER X RAY DIFFRACTION; PREFERRED ORIENTATIONS; REGIONAL METAMORPHISMS; STACKING STRUCTURES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL STRUCTURE; POLYTYPISM; SIMULATION; TALC; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

XIPHOPHORUS MACULATUS;

EID: 33748521557     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2006.2196     Document Type: Article

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