Effects of thickness and post deposition annealing on the properties of evaporated In2S3 thin films

Journal of Materials Science

Volumn 41, Issue 17, 2006, Pages 5519-5525

  Kumar, P M Ratheesh ^a   John, Teny Theresa ^a   Kartha, C Sudha ^a   Vijayakumar, K P ^a   Abe, T ^b   Kashiwaba, Y ^b  

^a Department of Physics   (India)

^b IWATE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; INDIUM COMPOUNDS; PHOTOSENSITIVITY; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTALLINE PHASE; INDIUM SULFIDE; OPTICAL BAND GAP; TRANSMISSION SPECTRA;

THIN FILMS;

EID: 33748520962     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0307-1     Document Type: Article

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