Accurate analysis and visualization of crystal structure of synthetic zeolite-A by X-ray powder diffractometry

Bunseki Kagaku

Volumn 55, Issue 6, 2006, Pages 397-404

  Konya, Takayuki ^a   Ozawa, Tetsuya ^a   Fujinawa, Go ^a   Oono, Atsuko ^b   Nakamura, Toshihiro ^b  

^a RIGAKU CORPORATION   (Japan)

^b MEIJI UNIVERSITY   (Japan)

Author keywords

Maximum entropy method; Powder X ray diffraction; Rietveld method; Zeolite

Indexed keywords

EID: 33748519252     PISSN: 05251931     EISSN: 05251931     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.55.397     Document Type: Article

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