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Volumn 313, Issue 5792, 2006, Pages 1423-1425

Measurement of the entanglement of two superconducting qubits via state tomography

Author keywords

[No Author keywords available]

Indexed keywords

MATRIX ALGEBRA; SUPERCONDUCTING MATERIALS; TOMOGRAPHY;

EID: 33748517413     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1130886     Document Type: Article
Times cited : (477)

References (21)
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    • note
    • Materials and methods are available as supporting material on Science Online.
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    • note
    • th) = 0.61.
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    • note
    • We acknowledge S. Waltman and the National Institute of Standards and Technology for support in building the microwave electronics. Devices were made at the UCSB and Cornell Nanofabrication Facilities, a part of the NSF-funded National Nanotechnology Infrastructure Network. N.K. acknowledges support of the Rothschild fellowship. This work was supported by Disruptive Technology Office under grant W911NF-04-1-0204 and by NSF under grant CCF-0507227.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.