Characterization of atomic motion governing grain boundary migration

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 11, 2006, Pages

  Zhang, Hao ^a   Srolovitz, David J ^a   Douglas, Jack F ^b   Warren, James A ^b  

^a Princeton University   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33748481748     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.115404     Document Type: Article

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