Measurement of the half brightness fluence for ZnS:Mn due to 20 keV electron irradiation

IEEE Nuclear Science Symposium Conference Record

Volumn 3, Issue , 2005, Pages 1284-1287

  Hollerman, W A ^a   Goedeke, S M ^b   Allison, S W ^b   Gray, P A ^c   Lewis, L A ^b  

^a UNIVERSITY OF LOUISIANA AT LAFAYETTE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c Integrated Concepts and Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BOMBARDMENT; FLUORESCENCE EFFICIENCY; LOW ENERGY ELECTRON (LEE) SYSTEMS;

ELECTRON IRRADIATION; FLUORESCENCE; ION BOMBARDMENT; ORE PELLETS; PHOSPHORS; POWDERS; RADIATION HARDENING;

ZINC SULFIDE;

EID: 33748465817     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596554     Document Type: Conference Paper

References (13)

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