Relation between grain boundary and electrical degradation of ZnO varistors

Key Engineering Materials

Volumn 320, Issue , 2006, Pages 117-120

  Takada, Masayuki ^a   Yoshikado, Shinzo ^a  

^a DOSHISHA UNIVERSITY   (Japan)

Author keywords

Antimony; Electrical degradation; Grain boundary; Triple point; V I characteristics; ZnO varistors

Indexed keywords

ANTIMONY; CURRENT VOLTAGE CHARACTERISTICS; GRAIN BOUNDARIES; MICROSTRUCTURE; OPTICAL MICROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DOPING; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

ELECTRICAL DEGRADATION; TRIPLE POINT; TWIN PLANE;

VARISTORS;

EID: 33748463772     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-411-1.117     Document Type: Conference Paper

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