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Volumn 34, Issue 6, 1987, Pages 1396-1401

Radiation induced latchup modeling of cmos ic's

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EID: 33748364430     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337487     Document Type: Article
Times cited : (3)

References (7)
  • 1
    • 0015770573 scopus 로고
    • Latch-up in CMOS Integrated Circuits
    • December
    • B.L. Gregory and B.D. Shafer, “Latch-up in CMOS Integrated Circuits”, IEEE Trans. Nuclear Science, Vol. NS-20, pp. 293–299, December 1973
    • (1973) IEEE Trans. Nuclear Science , vol.NS-20 , pp. 293-299
    • Gregory, B.L.1    Shafer, B.D.2
  • 2
    • 84937354397 scopus 로고
    • CMOS Latch-up Analysis and Prevention
    • Sandia Report SAND75-0371, June
    • B.D. Shafer, “CMOS Latch-up Analysis and Prevention”, Sandia Report SAND75-0371, June 1975
    • (1975)
    • Shafer, B.D.1
  • 3
    • 0038185073 scopus 로고
    • The Physics and Modeling of Latch-up in CMOS Integrated Circuits
    • Nov., DARPA Technical Rep. No. G-201-9, Contract DAAG-07-C-2684
    • D.B. Estreich, “The Physics and Modeling of Latch-up in CMOS Integrated Circuits”, Nov. 1980, DARPA Technical Rep. No. G-201-9, Contract DAAG-07-C-2684
    • (1980)
    • Estreich, D.B.1
  • 4
    • 0022243467 scopus 로고
    • Mechanisms for the Latch-up Window Effect in Integrated Circuits
    • December
    • A.H. Johnston and M.P. Baze, “Mechanisms for the Latch-up Window Effect in Integrated Circuits”, IEEE Trans. Nuclear Science, Vol. NS-32, pp 4018–4025, December, 1985
    • (1985) IEEE Trans. Nuclear Science , vol.NS-321 , pp. 4018-4025
    • Johnston, A.H.1    Baze, M.P.2
  • 5
    • 0021596157 scopus 로고
    • Transient Radiation Upset Simulations of CMOS Memory Circuits
    • Dec.
    • L.W. Massengill, S.E. Diehl, “Transient Radiation Upset Simulations of CMOS Memory Circuits”, IEEE Trans. Nuclear Science, Vol. NS-31, pp 1337, Dec. 1984
    • (1984) IEEE Trans. Nuclear Science , vol.NS-31 , pp. 1337
    • Massengill, L.W.1    Diehl, S.E.2
  • 6
    • 0003672607 scopus 로고
    • PISCES II: Poisson and Continuity Equation Solver
    • September, User's Manual prepared under U.S. Army Research Office Contract No. DAAG-29-83-K-0125
    • M.R. Pinto, C.S. Rafferty, and R.W. Dutton, “PISCES II: Poisson and Continuity Equation Solver”, September 1984, User's Manual prepared under U.S. Army Research Office Contract No. DAAG-29-83-K-0125
    • (1984)
    • Pinto, M.R.1    Rafferty, C.S.2    Dutton, R.W.3
  • 7
    • 0022868813 scopus 로고
    • Numerical Simulation of SEU Induced Latch-up
    • December
    • J.G. Rollins, W.A. Kolasinski, D.C. Marvin, and R. Koga, “Numerical Simulation of SEU Induced Latch-up”, IEEE Trans. Nuclear Science, Vol. NS-33, pp. 1565–1570, December 1986
    • (1986) IEEE Trans. Nuclear , vol.NS-33 , pp. 1565-1570
    • Rollins, J.G.1    Kolasinski, W.A.2    Marvin, D.C.3    Koga, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.