Power dependence of the frequency bias caused by spurious components in the microwave spectrum in atomic fountains

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 9, 2006, Pages 1584-1589

  Levi, Filippo ^b   Shirley, Jon H ^c   Heavner, Thomas P ^c   Yu, Dai Hyuk ^d   Jefferts, Steven R ^a,c  

^a IEEE   (United States)

^b ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FOUNTAIN FREQUENCY; FREQUENCY SHIFTS; POWER MICROWAVES;

FREQUENCIES; MICROWAVE SPECTROSCOPY; MICROWAVES; POWER CONTROL; SIGNAL TO NOISE RATIO;

SPURIOUS SIGNAL NOISE;

EID: 33748350295     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.1678186     Document Type: Article

References (12)

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