Transmission electron microscope imaging of single-walled carbon nanotube interactions and mechanics on nitride grids

Nanotechnology

Volumn 17, Issue 18, 2006, Pages 4706-4712

  Abrams, Z R ^a   Lereah, Y ^a   Hanein, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; IMAGING TECHNIQUES; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOTUBE INTERACTIONS; SILICON NITRIDE GRIDS; SINGLE-WALLED CARBON NANOTUBES; STRUCTURAL CHARACTERISTICS;

CARBON NANOTUBES;

EID: 33748350066     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/18/030     Document Type: Article

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