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Volumn 39, Issue 16, 2006, Pages 5471-5478

Thin film morphology of symmetric semicrystalline oxyethylene/oxybutylene diblock copolymers on silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; CRYSTALLIZATION; MORPHOLOGY; THIN FILMS;

EID: 33748313460     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma060405p     Document Type: Article
Times cited : (29)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.