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Volumn 83, Issue 4-9 SPEC. ISS., 2006, Pages 597-603
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Analysis of works of art down to the nanometric scale
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Author keywords
Conservation science; Ion beam analysis; TEM; Works of art analysis
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ION BEAMS;
NANOTECHNOLOGY;
SOCIAL ASPECTS;
SPECTROMETRY;
SYNCHROTRON RADIATION;
TRANSMISSION ELECTRON MICROSCOPY;
CONSERVATION SCIENCE;
ION BEAM ANALYSIS;
NANOMETRIC SCALE;
WORKS OF ART ANALYSIS;
MATERIALS SCIENCE;
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EID: 33748271768
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2005.12.020 Document Type: Article |
Times cited : (10)
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References (8)
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