Rainbow refractometry with a tailored incoherent semiconductor laser source

Applied Physics Letters

Volumn 89, Issue 9, 2006, Pages

  Peil, Michael ^a   Fischer, Ingo ^a,c   Elsäßer, Wolfgang ^a   Bakić, Saša ^a   Damaschke, Nils ^a   Tropea, Cameron ^a   Stry, Sandra ^b   Sacher, Joachim ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b Sacher Lasertechnik GmbH   (Germany)

^c VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMICS; IMAGING TECHNIQUES; MEASUREMENT THEORY; REFRACTOMETERS;

BROADBAND EMISSION; INCOHERENT LIGHT; RAINBOW REFRACTOMETRY;

SEMICONDUCTOR LASERS;

EID: 33748252635     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2338799     Document Type: Article

References (8)

1. S. Donati, Electro-optical Instrumentation: Sensing and Measuring with Lasers (Prentice-Hall. Englewood Cliffs, NJ, 2004). Chap. 7. pp. 277-291.
2. M. E. Brezinski and J. G. Fujimoto, IEEE J. Sel. Top. Quantum Electron. STQE-5, 1185 (1999).
3. M. Peil, I. Fischer, and W. Eisäßer, Phys. Rev. A 73, 023805 (2006).
4. A. Frohn and N. Roth, Dynamics of Droplets, Experimental Fluid Dynamics (Springer, Berlin, 2000), Chap. 7, pp. 245-249.
5. J. P. A. J. van Beeck and M. L. Riethmuller, Appl. Opt. 34, 1633 (1995).
6. J. P. A. J. van Beeck and M. L. Riethmuller, Appl. Opt. 35, 2259 (1996).
7. J. Hom and N. Chigier, Appl. Opt. 41, 1899 (2002).
8. H.-E. Albrecht, M. Borys, N. Damaschke, and C. Tropea, Meas. Sci. Technol. 10, 564 (1999).