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85176072008
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Minor deviations in the elemental analysis data are due to the formation of silicon carbide and silicon nitride
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Minor deviations in the elemental analysis data are due to the formation of silicon carbide and silicon nitride.
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10
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85176061785
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note
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-3, F(000) = 564, 6049 [I > 2σ(I)], R = 0.0543; Further details of the crystal structure investigation may be obtained from the Fachinformationszentrum Karlsruhe, D-76344 Eggenstein-Leopoldshafen (Germany), on quoting the depository number CSD-404264, 404265, and 404266.
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