Applying rough sets to prevent customer complaints for IC packaging foundry

Expert Systems with Applications

Volumn 32, Issue 1, 2007, Pages 151-156

  Yang, Hsu Hao ^a   Liu, Tzu Chiang ^a   Lin, Yen Ting ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Attributes selection; Customer complaints; IC packaging; Rough sets

Indexed keywords

CLASSIFICATION (OF INFORMATION); COMPUTATIONAL COMPLEXITY; DATA PROCESSING; FOUNDRY PRACTICE; INTEGRATED CIRCUIT MANUFACTURE; ROUGH SET THEORY;

ATTRIBUTES SELECTION; CUSTOMER COMPLAINTS; IC PACKAGING; ROUGH SETS;

ELECTRONICS PACKAGING;

EID: 33748133783     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2005.11.006     Document Type: Article

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