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Volumn 422, Issue 1-2, 2006, Pages
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Ce-Cu-Sb system at 670/870 K
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Author keywords
Casting; Electronic transport; Rare earth intermetallics; X ray diffraction
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Indexed keywords
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EID: 33748090264
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2005.12.010 Document Type: Letter |
Times cited : (5)
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References (17)
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