The use of design of experiments to evaluate the reliability of ferroelectric nonvolatile memories

ISAF 1992 - Proceedings of the 8th IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 1992, Pages 416-419

  Hadnagy, T D ^a   Mitra, S N ^a   Sheldon, D J ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN OF EXPERIMENTS; FERROELECTRIC MATERIALS; FERROELECTRIC RAM; FERROELECTRICITY;

FERROELECTRIC RANDOM ACCESS MEMORY DEVICES; FULL FACTORIAL EXPERIMENT; NOMINAL COMPOSITION; NON-VOLATILE MEMORY; OPERATING CONDITION; ORDERS OF MAGNITUDE; PROCESS MODIFICATIONS; PRODUCT PERFORMANCE;

FERROELECTRIC DEVICES;

EID: 33748027139     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.1992.300726     Document Type: Conference Paper

References (2)

1. "Ferroelectrics for Nonvolatile RAMs, " IEEE Spectrum, vol. 18, no. 7, pp. 30-33, 1989.
2. BBN Software Products. A Division of Bolt Beranek and Newman Inc., 150 Cambridge, MA 02140.