|
Volumn 27, Issue 14, 2006, Pages 1644-1649
|
Automatic thresholding for defect detection
|
Author keywords
Automatic thresholding; Defect detection
|
Indexed keywords
COMPUTER VISION;
DEFECTS;
IMAGE PROCESSING;
MODAL ANALYSIS;
QUALITY CONTROL;
AUTOMATIC THRESHOLDING;
DEFECT DETECTION;
HISTOGRAM;
OTSU METHOD;
PATTERN RECOGNITION SYSTEMS;
|
EID: 33747886893
PISSN: 01678655
EISSN: None
Source Type: Journal
DOI: 10.1016/j.patrec.2006.03.009 Document Type: Article |
Times cited : (533)
|
References (8)
|