Finite state machine testing based on growth and disappearance faults

FTCS 1992 - 22nd Annual International Symposium on Fault-Tolerant Computing

Volumn , Issue , 1992, Pages 238-245

  Srinivas, M K ^a   Jacob, J ^a   Agrawal, V D ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANCE;

COMBINATIONAL FUNCTIONS; COMBINATIONAL LOGIC; FINITE STATE; FUNCTIONAL TEST SEQUENCES; PROGRAMMABLE LOGIC ARRAY; TEST VECTORS;

COMPUTATION THEORY;

EID: 33747859799     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FTCS.1992.243578     Document Type: Conference Paper

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