In situ monitoring of crystal growth and dissolution of oriented layered double-hydroxide crystals immobilized on silicon

Journal of Crystal Growth

Volumn 294, Issue 1, 2006, Pages 53-59

  Greenwell, H C ^a   Bindley, L A ^b   Unwin, P R ^b   Holliman, P J ^a   Jones, W ^c   Coveney, P V ^d   Barnes, S L ^a  

^a BANGOR UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Anionic clay; Atomic force microscopy; Crystal growth; Layered double hydroxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DISSOLUTION; MINERALS; NANOSTRUCTURED MATERIALS; SINGLE CRYSTALS;

ANIONIC CLAY; CRYSTALLITE SIZES; LAYERED DOUBLE-HYDROXIDE (LDH); OSTWALD RIPENING PROCESS;

CRYSTAL GROWTH;

EID: 33747851766     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.05.048     Document Type: Article

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