Effect of magnetic field in electron-impact ion sources and simulation of electron trajectories

Review of Scientific Instruments

Volumn 77, Issue 8, 2006, Pages

  Park, Chang J ^a   Ahn, Jong R ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IONIZATION; IONS; MAGNETIC FIELD EFFECTS; MASS SPECTROMETERS; ROTATION;

AXIAL ION SOURCE; ELECTRON TRAJECTORY; HELICAL ROTATIONS; MAGNET INTENSITY;

ELECTRON BEAMS;

EID: 33747831052     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2336756     Document Type: Article

References (6)

1. R. M. Elliot, Mass Spectrometry, edited by C. A. McDowell (McGraw-Hill, New York, 1963).
2. A. O. C. Nier, Rev. Sci. Instrum. 18, 398 (1947).
3. J. Ishikawa, Y. Takeiri, and T. Takagi, Rev. Sci. Instrum. 55, 449 (1984).
4. S. L. Koontz and M. Bonner Denton, Int. J. Mass Spectrom. Ion Phys. 37, 227 (1981).
5. H. Somacal, H. Huck, D. E. Di Gregorio, J. O. Fernandez Niello, and M. Igarzabal, Nucl. Instrum. Methods Phys. Res. A 490, 9 (2002).
6. I. Brown, Handbook of Ion Sources, edited by B. Wolf (CRC, Boca Raton, FL, 1995), Chap. 1.