Sn-sb-o system by x-ray diffraction

Zhurnal Neorganicheskoj Khimii

Volumn 43, Issue 4, 1998, Pages 667-669

  Malinovskaya, T D ^a   Aparnev, A I ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747820597     PISSN: 0044457X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. Pyke D.R., Reid R., Tilley R.J. J. Chem. Soc. Faraday Trans. I. 1980. V. 76. P. 1174.
2. Cooper R.B., Advani G.N., Jordan A.C. J. Electron. Mater. 1981. V. 10. No 3. P. 455.
3. X-ray diffraction date cards, ASTM.